C. Monserie: search on Z-Library

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1

Reliability issues of silicon-dioxide structures—Application to FLOTOX EEPROM cells

C. Papadas, G. Ghibaudo, C. Monserié, G. Pananakakis

Journal:

Microelectronics Reliability

Year:

1993

Language:

english

File:

PDF, 1.77 MB

english, 1993

2

Reliability issues of offset drain transistors after different modes of static electrical stress

C. Papadas, P. Mortini, C. Monserié, G. Ghibaudo, G. Pananakakis

Journal:

Microelectronics Reliability

Year:

1993

Language:

english

File:

PDF, 610 KB

english, 1993

3

Impact of wafer charging on hot carrier reliability and optimization of latent damage detection methodology in advanced CMOS technologies

D. Goguenheim, A. Bravaix, S. Gomri, J.M. Moragues, C. Monserie, N. Legrand, P. Boivin

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 481 KB

english, 2005

4

Temperature, field and technological dependences of thin oxide breakdown characteristics

C. Monsérié, P. Mortini, G. Pananakakis, G. Ghibaudo

Journal:

Microelectronics Journal

Year:

1993

Language:

english

File:

PDF, 575 KB

english, 1993

5

On the charge build-up mechanisms in gate dielectrics

C. Papadas, G. Ghibaudo, F. Pio, C. Monsérie, G. Pananakakis, P. Mortini, C. Riva

Journal:

Solid-State Electronics

Year:

1994

Language:

english

File:

PDF, 1.08 MB

english, 1994

6

Comparison of oxide leakage currents induced by ion implantation and high field electric stress

D Goguenheim, A Bravaix, C Monserie, J.M Moragues, P Lambert, P Boivin

Journal:

Solid-State Electronics

Year:

2001

Language:

english

File:

PDF, 456 KB

english, 2001

7

Technosol genesis: identification of organo-mineral associations in a young Technosol derived from coking plant waste materials

Marie-France Monserie, Françoise Watteau, Geneviève Villemin, Stéphanie Ouvrard, Jean-Louis Morel

Journal:

Journal of Soils and Sediments

Year:

2009

Language:

english

File:

PDF, 313 KB

english, 2009

8

Reliability issues of offset drain transistors after different modes of electrical stress

C. Papadas, P. Mortini, C. Monsérié, G. Ghibaudo, G. Pananakakis

Journal:

Quality and Reliability Engineering International

Year:

1993

Language:

english

File:

PDF, 563 KB

english, 1993

9

Breakdown characteristics of gate and tunnel oxides versus field and temperature

Christophe Monsérié, Patrick Mortini, Gérard Ghibaudo, Georges Pananakakis

Journal:

Quality and Reliability Engineering International

Year:

1993

Language:

english

File:

PDF, 395 KB

english, 1993

10

Méfloquine et halofantrine, nouvelle thérapeutique contre le paludisme

Le Bras, J., Ringwald, P., Monsérié, C., Basco, L.K.

Journal:

La Revue de Médecine Interne

Year:

1991

File:

PDF, 666 KB

1991

11

[IEEE Proceedings of IEEE International Reliability Physics Symposium - Atlanta, GA, USA (1993.03.23-1993.03.25)] 31st Annual Proceedings Reliability Physics 1993 - Correlation between negative bulk oxide charge and breakdown: modeling, and new criteria for dielectric quality evaluation

Monserie, C., Papadas, C., Ghibaudo, G., Gounelle, C., Mortini, P., Pananakakis, G.

Year:

1993

Language:

english

File:

PDF, 542 KB

english, 1993

12

[IEEE 2004 24th International Conference on Microelectronics - Nis, Serbia (16-19 May 2004)] 2004 24th International Conference on Microelectronics (IEEE Cat. No.04TH8716) - Improved methodology based on hot carriers injections to detect wafer charging damage in advanced CMOS technologies

Goguenheim, D., Bravaix, A., Gomri, S., Moragues, J.M., Monserie, C., Legrand, N., Boivin, P.

Year:

2004

Language:

english

File:

PDF, 273 KB

english, 2004

13

Intérêt des journées d’évaluation et de prévention de la fragilité dans un canton éloigné des grands pôles médicaux

Bulvestre, M., Espel, L.-P., Ariza, A., Monsérie, S., Despres, C., Lareu, C., Montels, M.

Journal:

NPG Neurologie - Psychiatrie - Gériatrie

Year:

2017

Language:

french

File:

PDF, 378 KB

french, 2017

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